Kategorie
EFFITEST P-Series
Effitest P-Series is State-of-the-art FPGA-based high-speed test system for mass production of power discrete semiconductors. It is based on Effitest test platform with extension of high voltage and high current modules. With this configuration, Effitest P-Series is an ideal choice for testing IGBTs, MOS-FETs, Power modules and other high power semiconductors. Effitest is designed to test not only Si semiconductors, but also SiC and GaN!
Download brochure here
New Extensions available:
- UIS/UIL Avalanche testing for EAS and EAR measurements
- Capacitance measurement - Rg, Cg, Ciss, Coss, Crss
Available Configurations p900 series
- Effitest p910 2500V / 6A
- Effitest p911 600V / 100A
- Effitest p912 600V / 300A
- Effitest p913 2500V / 100A
- Effitest p914 2500V / 300A
- Effitest p915 2500V / 600A
- Effitest p916 2500V / 900A
- Effitest p917 2500V / 1200A
- Effitest p918 2500V / 1500A
We can offer also individual configurations up to 2500V / 1500A!
Multi-site testing capability
- On wafer
- On a handler
TESTING (Wafer, Bare Die, Packaged Componets):
- Transistors (GaN, SiC, etc.)
- MOS-FETs
- IGBTs
- MES-FETs
- Diodes
- Rectifiers
- Bridges
- SCRs
- Hybrid modules
- Power Devices
- Power Transistors
- Power Modules
Features
- Easy to install and setup - less than 3 hours from crate to test (test menu editor is currently under development)
- High speed test - around 200 ms to test for high power MOS-FET, 80ms for a power diode
- Full bridge IGBT modules testing
- Throughput up to 45,000 UPH
- Virtual scope – internal instrument allowing display of measured parameters – voltages, currents, etc. with 100kHz sample rate
- Reduced hardware set - decreases maintenance costs
- SW auto calibration - calibration with external DMM available with one click
- Easy programming and debugging of test programs (test menu editor is currently under development)
- Configurable test head - one or two CVI’s can be placed on each test head
- Life-cycle support
Virtual scope feature
Technical specification
- CVI unit consists of - 2×VI source 30V/3A, HV source 600V/10mA and Leakage current meter from 10nA range
- High Current Source LVI - 300A scalable up to 1500A
- On-board dual 16-bit ADC for voltage and current measurement
- High Voltage Source - HVI -2500V to +2500V
- Kelvin matrix MX_4A2B - with on board self-test
- Hi-current matrix MX_2C - with on board self-test
- Digitizer & Time Measurement Unit
- Resolution 16 bit force / measure
Four-quadrant scheme of LVI
Areas of application
- High volume production testing
- Quality control
- Failure analysis
- Engineering testing