EFFITEST P-Series

EFFITEST P-Series

Effitest P-Series is State-of-the-art FPGA-based high-speed test system for mass production of power discrete semiconductors. It is based on Effitest test platform with extension of high voltage and high current modules. With this configuration, Effitest P-Series is an ideal choice for testing IGBTs, MOS-FETs, Power modules and other high power semiconductors. Effitest is designed to test not only Si semiconductors, but also SiC and GaN!

 

Download brochure here 

Download detailed presentation here 

New Extensions available:

  • UIS/UIL Avalanche testing for EAS and EAR measurements
  • Capacitance measurement - Rg, Cg, Ciss, Coss, Crss
  • Wafer mapping

Available Configurations p900 series

  • Effitest p910 2500V / 6A
  • Effitest p911 600V / 100A
  • Effitest p912 600V / 300A
  • Effitest p913 2500V / 100A
  • Effitest p914 2500V / 300A
  • Effitest p915 2500V / 600A
  • Effitest p916 2500V / 900A
  • Effitest p917 2500V / 1200A
  • Effitest p918 2500V / 1500A

We can offer also individual configurations up to 2500V / 1500A!

Other special tests are RSurge, Thermal resistance, etc.

Multi-site testing capability

  • On wafer
  • On a handler

TESTING (Wafer, Bare Die, Packaged Componets):

  • Transistors (GaN, SiC, etc.)
  • MOS-FETs
  • IGBTs
  • MES-FETs
  • Diodes
  • Rectifiers
  • Bridges
  • SCRs
  • Hybrid modules
  • Power Devices
  • Power Transistors
  • Power Modules

 

Features

  • Easy and fast menu-like TP programming
  • High speed test -  around 100 ms to test for high power MOS-FET, 50ms for a power diode
  • Throughput up to 45,000 UPH
  • Single, Dual or Quad Configuration
  • Virtual scope – internal instrument allowing display of measured parameters – voltages, currents, etc. with 100kHz sample rate
  • Automatic calibration / selftest
  • Configurable test head - scalable platform 
  • Wide library of standard test methods (following MIL-STD-750 and IEC 60747)

     

Technical specification

  • CVI unit  - 2×VI source 30V/3A, HV source 600V/10mA and Leakage current meter from 10nA range
  • High Current Source LVI - 300A scalable up to 1500A
  • High Voltage Source - HVI -2500V to +2500V 
  • Hi-current matrix MX1 - with on board self-test
  • Digitizer & Time Measurement Unit with 100kHz for DC measurements, 500MHz for AC measurements
  • Resolution 16 bit force / measure

 

Areas of application

  • High volume production testing
  • Quality control
  • Failure analysis
  • Engineering testing

 

 

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