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UNITES Systems a.s.
Kpt. Macha 1372
757 01 Valašské Meziříčí
Czech republic
T: +420 571 757 230
E: e-mail contacts
EFFITEST - Discrete testers
The EFFITEST platform offers an ultra high-speed solution for testing discrete semiconductors in production environments. Currently, we provide three platforms: the Effitest E50 Series, tailored for small signal semiconductors such as JFETs, Bipolar transistors, Diodes, and LEDs, and the Effitest P100 and P900 Series, which are designed for power semiconductors including MOS-FETs, IGBTs, Power Diodes, etc. These platforms are engineered for seamless integration with all standard handlers available on the market and are also capable of testing GaN and SiC devices.
The Effitest E50 Series is high-speed tester for small-signal discrete devices (SSD). Throughput up to 72 ...
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The Effitest P100 Series represents a compact desktop version of bigger P900 Series. Tailored for both la ...
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The Effitest P900 Series stands as an advanced high-speed testing system designed for the demanding produ ...
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The EFFITEST series can be extended by the Avalanche option (for UIS and UIL test), for evaluating EAS an ...
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EFFITEST series newly allow capacitance measurements together with external LCR bridge (such as E4980AL-1 ...
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Discrete semiconductor testers have been in use for several decades. While many of these testers were hig ...
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