EFFITEST - Discrete testers

EFFITEST - Discrete testers

The EFFITEST platform offers an ultra high-speed solution for testing discrete semiconductors in production environments. Currently, we provide three platforms: the Effitest E50 Series, tailored for small signal semiconductors such as JFETs, Bipolar transistors, Diodes, and LEDs, and the Effitest P100 and P900 Series, which are designed for power semiconductors including MOS-FETs, IGBTs, Power Diodes, etc. These platforms are engineered for seamless integration with all standard handlers available on the market and are also capable of testing GaN and SiC devices.

EFFITEST E50 Series
The Effitest E50 Series is high-speed tester for small-signal discrete devices (SSD). Throughput up to 72 ...
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EFFITEST P100 Series
The Effitest P100 Series represents a compact desktop version of bigger P900 Series. Tailored for both la ...
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EFFITEST P900 Series
The Effitest P900 Series stands as an advanced high-speed testing system designed for the demanding produ ...
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Avalanche Extension - Unclamped inductive switching/load (UIS/UIL)
The EFFITEST series can be extended by the Avalanche option (for UIS and UIL test), for evaluating EAS an ...
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Capacitance Extension - Measurement of Cg, Rg, Ciss, Coss, Crss
EFFITEST series newly allow capacitance measurements together with external LCR bridge (such as E4980AL-1 ...
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Replacement of older testers
Discrete semiconductor testers have been in use for several decades. While many of these testers were hig ...
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