EFFITEST E-Series

EFFITEST E-Series

EFFITEST E-Series is ultra high-speed discrete semiconductor tester perfect for use in production. Throughput up to 72,000 UPH. Ideal for testing small signal transistors, diodes, LEDs, MOSFETs, JFETs and other semiconductors up to 600V / 6A. Lowest current range is 10nA. Ideal also for GaN and SiC transistors. Effitest E-Series series offers 1 model - e50 in single, dual configuration and quad configuration. All configurations are up to 600V / 6A.

 

Download information leaflet here

Features

  • Effitest e50 max. ranges up to 600V/6A 
  • Single (3 pin), Dual (e50, 3 + 3 pin) and Quad (e50, 3 + 3 + 3 + 3 pin) configuration
  • Pincount extendable up to 10 pins by external multiplexer MUX10 
  • Connection to a handler or a wafer prober
  • Up to 32 HW bins and 256 SW bins
  • Throughput up to 72,000 UPH /  less than 35 ms to test a bipolar transistor
  • Parallel and serial testing
  • Virtual scope – internal instrument allowing display of waveforms
  • Menu-driven test editor for easy programming test programs
  • Final test & QA test ready

 

Testing

  • Bipolar transistors 
  • MOSFETs (also GaN and SiC)
  • Diodes & Zener diodes
  • Voltage regulators
  • LED, Photodiodes, Optocouplers 
  • Phototransistors 
  • MOSFET Drivers
  • IGBT Drivers

Learn more

 

Contact: 

 Ondřej Běťák            

Ondřej Běťák

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