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EFFITEST E50 Series
The Effitest E50 Series is high-speed tester for small-signal discrete devices (SSD). Throughput up to 72,000 UPH. Ideal for testing Transistors, Diodes, Zener Diodes, LEDs, MOSFETs, JFETs and other semiconductors up to 800V / 10A. Lowest current range is 10nA. Ideal also for GaN and SiC transistors. Effitest E50 Series is available in single, dual configuration and quad configuration. All configurations are up to 800V / 10A.
Japan web pageDownload information leaflet here
Testing
- Bipolar transistors
- MOSFETs (also GaN and SiC)
- Diodes & Zener diodes
- Voltage regulators
- LED, Photodiodes, Optocouplers
- Phototransistors
- MOSFET Drivers
- IGBT Drivers
Features
- Effitest e50 max. ranges up to 800V / 10A (800V@100mA, 2x 30V@10A)
- Single (3 pin), Dual (e50, 3 + 3 pin) and Quad (e50, 3 + 3 + 3 + 3 pin) configuration
- Pincount extendable up to 10 pins by external multiplexer MUX10
- Connection to a handler or a wafer prober
- Up to 32 HW bins and 256 SW bins
- Throughput up to 72,000 UPH / less than 35 ms to test a bipolar transistor
- Parallel and serial testing
- Virtual scope – internal instrument allowing display of waveforms
- Menu-driven test editor for easy programming test programs
- Extension for Capacitance measurements - Cg, Rg
- Wafer mapping feature in Datalog
- Final test & QA test ready
Areas of applications
- Wafer testing
- Known-good die (KGD) testing
- Packaged component testing
