EFFITEST E-Series for Optoelectronic Discrete Devices

Ideal for high-volume production, laboratory quality control, failure analysis, and engineering testing of photodiodes, phototransistors, infrared sensors, and similar optosemiconductors. The Effitest E-Series offers three flexible models - e50 Single, Dual, and Quad - supporting advanced capabilities to meet a wide range of production and laboratory requirements. 

TESTING 

Designed to Test: 
- Photodiodes (Si, InGaAs, etc.) 
- Phototransistors 
- Photosensors 
- Infrared Sensors 
- LEDs  
- Optocouplers  

Key Capabilities: 

- High-speed true parallel or serial testing 
- Up to 72,000 Units Per Hour (UPH) 
- Extendable DUT pin counts (up to 10 pins) 
- Self-diagnostic relay system 
- Easy, menu-driven test program editor 
- Virtual oscilloscope for waveform analysis 

Voltage and Current Measurement: 

- Voltage range: up to 800V (resolution 1µV to 24mV) 
- Current range: up to 10A (resolution 300fA to 300µA) 
- Accuracy: ±0.1% Full Scale Range (FSR) 

Hardware and Software: 

- Up to 32 hardware bins and 256 software bins 
- Integrated wafer mapping and sorting 
- SCADUS software with operator/engineer modes 
- Data logging with export to .csv, .xlsx, .stdf, .pdf 

WAFER MAPPING 

- Full wafer mapping capabilities for Effitest and Unimet platforms 
- Advanced sorting up to 256 software bins and 32 hardware bins 
- Histograms, trends, and statistical process control (Cpk, Cgm analysis) 

TESTED PARAMETERS FOR OPTOELECTRONIC DISCRETE DEVICES 

Photodiodes: 

- Forward Voltage (VF) 
- Dark Current (ID) 
- Light Current (IL)
- Breakdown Voltage (VBR) 
- Responsivity 
- Shunt Resistance
- and more
  

Phototransistors: 

- Collector Current (IC) vs. Light Intensity 
- Collector-Emitter Saturation Voltage (VCEsat) 
- Current Gain (hFE/hfe) 
- Breakdown Voltage (V(BR)CEO, V(BR)CBO) 
- Dark Current (ICES) 
 

Optional Extension: 

- LCR Meter Integration for measuring capacitances
- Optical Power Source (Spectrometer, LED Drivers) 
- Thermal Resistance Testing 

VIRTUAL OSCILLOSCOPE 

- Visualization of dynamic electrical response 
- Capture transient behavior and switching times 
- Export measurement results directly to data formats for analysis

APPLICATIONS 

- Production testing of photodiodes, phototransistors, and infrared sensors 
- Quality testing and R&D testing 
- Laboratory testing and characterization of optoelectronic discrete components 
- Incoming inspection of optoelectronic devices 
- Failure analysis and engineering sample evaluation 
- Wafer-level optoelectronic device testing