Next generation ICT+FCT solution offers breakthrough performance Multi-Core Parallel testing with up to 4 independent cores for high-throughput testing. Offering improved measurement accuracy, the TR5001Q/D SII's new built-in auto-calibration and self diagnostics ensure long-term testing reliability.


  • New Generation Flexible Multi-Core Parallel Tester 
  • State-of-the-Art Serial Test Controller with up to 8 ports on any pin 
  • Limited access solution and functional test expansion using PXI modules 
  • Built-in Self Diagnostics and Auto-Calibration function
  • High-Accuracy Measurement and Testing 
  • Intuitive UI with flow-based easy program development


Tester Specifications

Analog/hybrid test points

  • TR5001Q SII: 4096
  • TR5001D SII: 3328
  • TR5001 SII: 3456

Operating System

  • Microsoft® Windows compatible PC with USB, Windows 10

Fixture Type

  • Offline press type fixture

Standard Testing Components

Analog Test Hardware

  • 6-wire measurement switching matrix
  • Programmable AC/DC/DC High voltage and current sources
  • AC/DC voltage, DC current measurement
  • Component R/L/C measurement


Optional Components

Analog Hardware

  • TestJet vectorless open circuit detection
  • Arbitrary Waveform Generator

Digital Testing

  • Non-multiplexing 1:1 per pin architecture with independent per-pin level setting
  • Serial Test Controller (STC) Programming
  • DUT power supplies: 5 V@3 A, 3.3 V@3 A, 12 V@3A, -12 V@1 A and 24 V@3 A
  • DPS Programmable DUT Power supply :
  • (1) DPS3514: 30Vmax/5Amax/100Wmax per channel /4CH per DPS
  • (2) DPS3122: 30Vmax/10Amax/200Wmax per channel /2CH per DPS
  • Programmable DUT power supplies: 75 V / 8 A max, 200W maximum output power
  • Includes BScan Chain Test, BScan Cluster Test, BScan Virtual Nails Test, BScan Virtual Chain Test and IEEE1149.6 Test
  • Up to 8 High Speed Serial Ports, On-board Flash, EEPROM, MAC programming

Yield Management System

  • YMS 4.0



  • 1050 x 850 x 1735 mm


  • 300 kg
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