EFFITEST P900 Series

EFFITEST P900 Series

The Effitest P900 Series stands as an advanced high-speed testing system designed for the demanding production requirements of power discrete semiconductors. The Effitest P900 Series architecture shares the instruments of the Effitest platform with extension of high voltage, high current modules and additional extensions (UIL/UIS), Cg, Rg. Tailored for testing IGBTs, MOS-FETs, Power modules, Power Diodes, and other high-power semiconductors, the Effitest P900 Series showcases remarkable versatility. Notably, Effitest is test traditional Si semiconductors but also cutting-edge materials like SiC and GaN.

Download brochure here 


New Extensions available:

  • UIS/UIL Avalanche testing for EAS and EAR measurements
  • Capacitance measurement - Rg, Cg, Ciss, Coss, Crss

Available Configurations p900 series

  • Effitest p910 2500V / 6A
  • Effitest p911 600V / 100A
  • Effitest p912 600V / 300A
  • Effitest p913 2500V / 100A
  • Effitest p914 2500V / 300A
  • Effitest p915 2500V / 600A
  • Effitest p916 2500V / 900A
  • Effitest p917 2500V / 1200A
  • Effitest p918 2500V / 1500A

We can offer also individual configurations up to 2500V / 1500A!

Multi-site testing capability

  • On wafer
  • On a handler

TESTING (Wafer, Bare Die, Packaged Componets):

  • Transistors (GaN, SiC, etc.)
  • MOS-FETs
  • IGBTs
  • MES-FETs
  • Diodes
  • Rectifiers
  • Bridges
  • SCRs
  • Hybrid modules
  • Power Devices
  • Power Transistors
  • Power Modules



  • Easy to install and setup - less than 3 hours from crate to test (test menu editor is currently under development)
  • High speed test -  around 200 ms to test for high power MOS-FET, 80ms for a power diode
  • Full bridge IGBT modules testing
  • Throughput up to 45,000 UPH
  • Virtual scope – internal instrument allowing display of measured parameters – voltages, currents, etc. with 100kHz sample rate
  • Reduced hardware set - decreases maintenance costs
  • SW auto calibration - calibration with external DMM available with one click
  • Easy programming and debugging of test programs (test menu editor is currently under development)
  • Configurable test head - one or two CVI’s can be placed on each test head
  • Life-cycle support

    Virtual scope
        Virtual scope feature

Technical specification

  • CVI unit consists of 2×VI source 30V/3A, HV source 600V/10mA and Leakage current meter from 10nA range
  • High Current Source LVI  300A scalable up to 1500A
  • On-board dual 16-bit ADC for voltage and current measurement
  • High Voltage Source HVI -2500V to +2500V 
  • Kelvin matrix MX_4A2B with on board self-test
  • Hi-current matrix MX_2C with on board self-test
  • Digitizer & Time Measurement Unit
  • Resolution 16 bit force / measure

              Four-quadrant scheme of LVI


Areas of application

  • High volume production testing
  • Quality control
  • Failure analysis
  • Engineering testing