TR8100LV

Designed for testing large and complex PCBAs, the TR8100LV is TRI's top-of-the-line board test system targeting the low-voltage testing market. TR8100LV's vacuum system ensures full pin contact and with up to 3,584 pin digital MUX-free architecture, the system allows for faster and simpler testing of large pin-count devices and fast program development. Included *TRI ToggleScan® and VregTest® technology combine Boundary Scan with solutions for limited test access boards. *"ToggleScan®" and " VregTest®" are registered trademarks of Test Research, Inc.

Features

Digital 1:1 driver/receiver per pin architecture design
High fault coverage test solution with vacuum fixture
Low voltage device testing and rapid test speed
Friendly UI with fast and easy program development

Tester Specifications

Analog/hybrid test points

TR8100LV: 3584
TR8100LLV: 5632

Operating System

Microsoft® Windows compatible PC, Windows 10

Fixture Type

Offline press or vacuum type fixture

Standard Testing Components

Analog Test Hardware

6-wire measurement switching matrix
Programmable AC/DC/DC High voltage and current sources
AC/DC voltage, DC current measurement, frequency
Component R/L/C measurement
Synthesized Arbitrary Waveform Generator
TestJet vectorless open circuit detection

Digital Testing

Non-multiplexing 1:1 per pin architecture with independent per-pin level setting
DUT power supplies: 5 V@5 A, 3.3 V@5 A, 12 V@5A, 0.2~20 V@3 A and -3~-20 V@3 A
On-board Flash, EEPROM, MAC programming

Optional Components

Analog Hardware

Fixture Conversion Kits for Teradyne, GenRad

Digital Testing

Programmable DUT power supplies: 75 V / 8 A, 200W maximum output power
Includes BScan Chain Test, BScan Cluster Test, BScan Virtual Nails Test, BScan Virtual Chain Test and IEEE1149.6 Test

Yield Management System

YMS 4.0

Dimensions

WxDxH

TR8100LV: 1150 x 850 x 800 mm
TR8100LLV: 1550 x 850 x 800 mm

Weight

TR8100LV: 390 kg
TR8100LLV: 450 kg