The Effitest E50 Series is high-speed tester for small-signal discrete devices (SSD). Throughput up to 72,000 UPH. Ideal for testing Transistors, Diodes, Zener Diodes, LEDs, MOSFETs, JFETs and other semiconductors up to 800V / 10A. Lowest current range is 10nA. Ideal also for GaN and SiC transistors. Effitest E50 Series is available in single, dual configuration and quad configuration. All configurations are up to 800V / 10A.


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  • Bipolar transistors 
  • MOSFETs (also GaN and SiC)
  • Diodes & Zener diodes
  • Voltage regulators
  • LED, Photodiodes, Optocouplers 
  • Phototransistors 
  • MOSFET Drivers
  • IGBT Drivers


  • Effitest e50 max. ranges up to 800V / 10A (800V@100mA, 2x 30V@10A)
  • Single (3 pin), Dual (e50, 3 + 3 pin) and Quad (e50, 3 + 3 + 3 + 3 pin) configuration
  • Pincount extendable up to 10 pins by external multiplexer MUX10 
  • Connection to a handler or a wafer prober
  • Up to 32 HW bins and 256 SW bins
  • Throughput up to 72,000 UPH /  less than 35 ms to test a bipolar transistor
  • Parallel and serial testing
  • Virtual scope – internal instrument allowing display of waveforms
  • Menu-driven test editor for easy programming test programs
  • Extension for Capacitance measurements - Cg, Rg
  • Wafer mapping feature in Datalog
  • Final test & QA test ready

Areas of applications

  • Wafer testing
  • Known-good die (KGD) testing
  • Packaged component testing

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