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EFFITEST P-Series
Effitest P-Series is State-of-the-art FPGA-based high-speed test system for mass production of power discrete semiconductors. It is based on Effitest test platform with extension of high voltage and high current modules. With this configuration, Effitest P-Series is an ideal choice for testing IGBTs, MOS-FETs, Power modules and other high power semiconductors. Effitest is designed to test not only Si semiconductors, but also SiC and GaN!
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New Extensions available:
- UIS/UIL Avalanche testing for EAS and EAR measurements
- Capacitance measurement - Rg, Cg, Ciss, Coss, Crss
Available Configurations p900 series
- Effitest p910 2500V / 6A
- Effitest p911 600V / 100A
- Effitest p912 600V / 300A
- Effitest p913 2500V / 100A
- Effitest p914 2500V / 300A
- Effitest p915 2500V / 600A
- Effitest p916 2500V / 900A
- Effitest p917 2500V / 1200A
- Effitest p918 2500V / 1500A
We can offer also individual configurations up to 2500V / 1500A!
Other special tests are RSurge, Thermal resistance, etc.
Multi-site testing capability
- On wafer
- On a handler
TESTING (Wafer, Bare Die, Packaged Componets):
- Transistors (GaN, SiC, etc.)
- MOS-FETs
- IGBTs
- MES-FETs
- Diodes
- Rectifiers
- Bridges
- SCRs
- Hybrid modules
- Power Devices
- Power Transistors
- Power Modules
Features
- Easy and fast menu-like TP programming
- High speed test - around 100 ms to test for high power MOS-FET, 50ms for a power diode
- Throughput up to 45,000 UPH
- Single, Dual or Quad Configuration
- Virtual scope – internal instrument allowing display of measured parameters – voltages, currents, etc. with 100kHz sample rate
- Automatic calibration / selftest
- Configurable test head - scalable platform
- Wide library of standard test methods (following MIL-STD-750 and IEC 60747)
Technical specification
- CVI unit - 2×VI source 30V/3A, HV source 600V/10mA and Leakage current meter from 10nA range
- High Current Source LVI - 300A scalable up to 1500A
- High Voltage Source - HVI -2500V to +2500V
- Hi-current matrix MX1 - with on board self-test
- Digitizer & Time Measurement Unit with 100kHz for DC measurements, 500MHz for AC measurements
- Resolution 16 bit force / measure
Areas of application
- High volume production testing
- Quality control
- Failure analysis
- Engineering testing