Development and production of measuring equipment
EN CZ
HomeProductsEFFITEST P-Series

Categories

Contact: Ondřej Běťák

Ondřej Běťák        

E: obetak@unites.cz

T: +420 602 555 872

    LinkedIn  

EFFITEST P-Series

EFFITEST P-Series

Effitest P-Series is State-of-the-art FPGA-based high-speed test system for mass production of power discrete semiconductors. It is based on Effitest test platform with extension of high voltage and high current modules. With this configuration, Effitest P-Series is an ideal choice for testing IGBTs, MOS-FETs, Power modules and other high power semiconductors. Effitest is designed to test not only Si semiconductors, but also SiC and GaN!

 

Download datasheet here 

Dowload presentation about Quad Site Testing here 

 

We offer correlation tests and sample testing for free!

Available Configurations p900 series

  • Effitest p910 2500V / 6A
  • Effitest p911 600V / 100A
  • Effitest p912 600V / 300A
  • Effitest p913 2500V / 100A
  • Effitest p914 2500V / 300A
  • Effitest p915 2500V / 600A
  • Effitest p916 2500V / 900A
  • Effitest p917 2500V / 1200A
  • Effitest p918 2500V / 1500A

We can offer also individual configurations up to 2500V / 1500A!

Multi-site testing capability:

  • Dual site
  • Quad site

TESTING (Wafer, Bare Die, Packaged Componets):

  • Transistors (GaN, SiC, etc.)
  • MOS-FETs
  • IGBTs
  • MES-FETs
  • Diodes
  • Rectifiers
  • Bridges
  • SCRs
  • Hybrid modules
  • Power Devices
  • Power Transistors
  • Power Modules

 

Features

  • Easy to install and setup - less than 3 hours from crate to test (test menu editor is currently under development)
  • High speed test -  around 200 ms to test for high power MOS-FET, 80ms for a power diode
  • Full bridge IGBT modules testing
  • Throughput up to 45,000 UPH
  • Virtual scope – internal instrument allowing display of measured parameters – voltages, currents, etc. with 100kHz sample rate
  • Reduced hardware set - decreases maintenance costs
  • SW auto calibration - calibration with external DMM available with one click
  • Easy programming and debugging of test programs (test menu editor is currently under development)
  • Configurable test head - one or two CVI’s can be placed on each test head
  • Life-cycle support


    Virtual scope
        Virtual scope feature

Technical specification

  • CVI unit consists of - 2×VI source 30V/3A, HV source 600V/10mA and Leakage current meter from 10nA range
  • High Current Source LVI - 300A scalable up to 1500A
  • On-board dual 16-bit ADC for voltage and current measurement
  • High Voltage Source - HVI -2500V to +2500V 
  • Kelvin matrix MX_4A2B - with on board self-test
  • Hi-current matrix MX_2C - with on board self-test
  • Digitizer & Time Measurement Unit
  • Resolution 16 bit force / measure


              Four-quadrant scheme of LVI

 

Areas of application

  • High volume production testing
  • Quality control
  • Failure analysis
  • Engineering testing

 

 

Scroll up