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Contact: Ondřej Běťák

Ondřej Běťák        

E: obetak@unites.cz

T: +420 602 555 872

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EFFITEST P900 Series

EFFITEST P900 Series

The Effitest P900 Series stands as an advanced high-speed testing system designed for the demanding production requirements of power discrete semiconductors. The Effitest P900 Series architecture shares the instruments of the Effitest platform with extension of high voltage, high current modules and additional extensions (UIL/UIS), Cg, Rg. Tailored for testing IGBTs, MOS-FETs, Power modules, Power Diodes, and other high-power semiconductors, the Effitest P900 Series showcases remarkable versatility. Notably, Effitest tests traditional Si semiconductors but also cutting-edge materials like SiC and GaN.

 

Japan web page Japan web page 

Download brochure here 

Download detailed presentation here 

Animated video of Quad site testing on wafer here

 

New Extensions available:

 

Available Configurations p900 series

  • An example of assigning a model name: Effitest p914 → 2500V / 300A

 

Other special tests are RSurge, Thermal resistance, etc.

Multi-site testing capability

  • On wafer - dual site, quad site, octa site, etc.
  • On a handler
  • Ping-pong mode available (multiple sites with multiple different devices)

TESTING (Wafer, Bare Die, Packaged Componets):

  • Transistors (GaN, SiC, etc.)
  • MOS-FETs
  • IGBTs
  • MES-FETs
  • Diodes
  • Rectifiers
  • Bridges
  • SCRs
  • Hybrid modules
  • Power Devices
  • Power Transistors
  • Power Modules

 

Features

  • Easy and fast menu-like TP programming
  • High speed test -  around 100 ms to test for high power MOS-FET, 50ms for a power diode
  • Throughput up to 45,000 UPH
  • Single, Dual or Quad Configuration
  • Virtual scope – internal instrument allowing display of measured parameters – voltages, currents, etc. with 100kHz sample rate
  • Automatic calibration / selftest
  • Configurable test head - scalable platform 
  • Wide library of standard test methods (following MIL-STD-750 and IEC 60747)
  • Wafer mapping
  • High-precision measurements – the tester delivers highly accurate results that meet strict industry standards.
  • Modular and flexible design – easily adaptable to various testing scenarios and requirements.
  • Ideal for both production and development – a perfect tool for fine-tuning and verifying new components and prototypes.
  • Excellent price-performance ratio – cost-effective while maintaining high quality and reliability.
  • Supports a wide range of components – compatible with various semiconductor and electronic components.
  • Fast return on investment – efficient use of the tester leads to cost savings and increased productivity.
  • Advanced automation capabilities – seamless integration into existing production processes.
  • Intuitive user interface – simple operation for maximum work efficiency.
     

Technical specification

  • CVI unit  2×VI source 30V/3A, HV source 600V/10mA and Leakage current meter from 10nA range
  • High Current Source LVI 300A scalable up to 1500A
  • High Voltage Source HVI -2500V to +2500V, configurable up to 5000V 
  • Hi-current matrix MX1 with on board self-test
  • Digitizer & Time Measurement Unit with 100kHz for DC measurements, 500MHz for AC measurements
  • Resolution 16 bit force / measure

 

Areas of application

  • High volume production testing
  • Quality control
  • Failure analysis
  • Engineering testing

 

 

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