Effitest P-Series is State-of-the-art FPGA-based high-speed test system for mass production of power discrete semiconductors. It is based on Effitest test platform with extension of high voltage and high current modules. With this configuration, Effitest P-Series is an ideal choice for testing IGBTs, MOS-FETs, Power modules and other high power semiconductors. Effitest is designed to test not only Si semiconductors, but also SiC and GaN!


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New Extensions available:

  • UIS/UIL Avalanche testing for EAS and EAR measurements
  • Capacitance measurement - Rg, Cg, Ciss, Coss, Crss
  • Wafer mapping

Available Configurations p900 series

  • Effitest p910 2500V / 6A
  • Effitest p911 600V / 100A
  • Effitest p912 600V / 300A
  • Effitest p913 2500V / 100A
  • Effitest p914 2500V / 300A
  • Effitest p915 2500V / 600A
  • Effitest p916 2500V / 900A
  • Effitest p917 2500V / 1200A
  • Effitest p918 2500V / 1500A

We can offer also individual configurations up to 2500V / 1500A!

Other special tests are RSurge, Thermal resistance, etc.

Multi-site testing capability

  • On wafer
  • On a handler

TESTING (Wafer, Bare Die, Packaged Componets):

  • Transistors (GaN, SiC, etc.)
  • MOS-FETs
  • IGBTs
  • MES-FETs
  • Diodes
  • Rectifiers
  • Bridges
  • SCRs
  • Hybrid modules
  • Power Devices
  • Power Transistors
  • Power Modules



  • Easy and fast menu-like TP programming
  • High speed test -  around 100 ms to test for high power MOS-FET, 50ms for a power diode
  • Throughput up to 45,000 UPH
  • Single, Dual or Quad Configuration
  • Virtual scope – internal instrument allowing display of measured parameters – voltages, currents, etc. with 100kHz sample rate
  • Automatic calibration / selftest
  • Configurable test head - scalable platform 
  • Wide library of standard test methods (following MIL-STD-750 and IEC 60747)


Technical specification

  • CVI unit  2×VI source 30V/3A, HV source 600V/10mA and Leakage current meter from 10nA range
  • High Current Source LVI 300A scalable up to 1500A
  • High Voltage Source HVI -2500V to +2500V 
  • Hi-current matrix MX1 with on board self-test
  • Digitizer & Time Measurement Unit with 100kHz for DC measurements, 500MHz for AC measurements
  • Resolution 16 bit force / measure


Areas of application

  • High volume production testing
  • Quality control
  • Failure analysis
  • Engineering testing



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