Categories
TR5001 SII SERIES
Next generation ICT+FCT solution offers breakthrough performance Multi-Core Parallel testing with up to 4 independent cores for high-throughput testing. Offering improved measurement accuracy, the TR5001Q/D SII's new built-in auto-calibration and self diagnostics ensure long-term testing reliability.
Features
- New Generation Flexible Multi-Core Parallel Tester
- State-of-the-Art Serial Test Controller with up to 8 ports on any pin
- Limited access solution and functional test expansion using PXI modules
- Built-in Self Diagnostics and Auto-Calibration function
- High-Accuracy Measurement and Testing
- Intuitive UI with flow-based easy program development
Tester Specifications
Analog/hybrid test points
- TR5001Q SII: 4096
- TR5001D SII: 3328
- TR5001 SII: 3456
Operating System
- Microsoft® Windows compatible PC with USB, Windows 10
Fixture Type
- Offline press type fixture
Standard Testing Components
Analog Test Hardware
- 6-wire measurement switching matrix
- Programmable AC/DC/DC High voltage and current sources
- AC/DC voltage, DC current measurement
- Component R/L/C measurement
Optional Components
Analog Hardware
- TestJet vectorless open circuit detection
- Arbitrary Waveform Generator
Digital Testing
- Non-multiplexing 1:1 per pin architecture with independent per-pin level setting
- Serial Test Controller (STC) Programming
- DUT power supplies: 5 V@3 A, 3.3 V@3 A, 12 V@3A, -12 V@1 A and 24 V@3 A
- DPS Programmable DUT Power supply :
- (1) DPS3514: 30Vmax/5Amax/100Wmax per channel /4CH per DPS
- (2) DPS3122: 30Vmax/10Amax/200Wmax per channel /2CH per DPS
- Programmable DUT power supplies: 75 V / 8 A max, 200W maximum output power
- Includes BScan Chain Test, BScan Cluster Test, BScan Virtual Nails Test, BScan Virtual Chain Test and IEEE1149.6 Test
- Up to 8 High Speed Serial Ports, On-board Flash, EEPROM, MAC programming
Yield Management System
- YMS 4.0
Dimensions
WxDxH
- 1050 x 850 x 1735 mm
Weight
- 300 kg