EFFITEST - Discrete testers

The EFFITEST platform delivers an ultra high-speed solution for testing discrete semiconductors in production environments, now enhanced with advanced curve-tracing capability. We offer three platforms: the Effitest E50 Series, optimized for small-signal devices such as JFETs, bipolar transistors, diodes, and LEDs; and the Effitest P100 and P900 Series, designed for power semiconductors including MOSFETs, JFETs, BJTs, IGBTs, thyristors (SCRs), power diodes, and more. All EFFITEST systems integrate seamlessly with standard market handlers and support testing of next-generation GaN and SiC devices.