Products

CMT - Tester
Test system based on VPC G12 interface, where signal conditioning cards are located directly from the rea ...
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UNIMET 2020
UNIMET 2020 represents a unique and flexible linear and mixed signal test platform for cost effective tes ...
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UNIMET 1037
The UNIMET 1037 is a laboratory benchtop test system designed for discrete semiconductors, including bipo ...
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Test Adapters UNIMET
Family test adapters are a set of SW and HW. SW is mostly designed as menu-driven for users comfort. T ...
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AC measurement of trr and tON, tOFF
TA37 is designed to be used together with either UNIMET 1037 or UNIMET 2020. TA37.TIM extension allows to ...
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EFFITEST E50 Series
The Effitest E50 Series is high-speed tester for small-signal discrete devices (SSD). Throughput up to 72 ...
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EFFITEST P100 Series
The Effitest P100 Series represents a compact desktop version of bigger P900 Series. Tailored for both la ...
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EFFITEST P900 Series
The Effitest P900 Series stands as an advanced high-speed testing system designed for the demanding produ ...
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Avalanche testing - Unclamped inductive switching/load (UIS/UIL)
EFFITEST series allows avalanche measurements UIS/UIL for measuring EAS and EAR. This measurement is spec ...
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Measurement of Capacitances on Semiconductors
EFFITEST series newly allow capacitance measurements together with external LCR bridge (such as E4980AL-1 ...
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Replacement of older testers
Discrete semiconductor testers have been in use for several decades. While many of these testers were hig ...
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Boundary scan
Boundary-scan (also known as JTAG or IEEE Std 1149.1) is an electronic serial four port jtag interface th ...
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